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Automated optical inspection uses machine vision inspection technology to perform high-speed and high-precision optical image verification and replace time-consuming and unstable manual visual inspection. Chroma offers AOI solutions that are equipped with high-resolution optical imaging, multi-functional light sources, and in-house developed white light interferometry. Combining innovative algorithms and AI analysis, the AOI solutions can perform accurate and reliable defect detection, color analysis, and sub-nano 3D profile measurement when integrated into a high-speed automated production line. Chroma's AOI solutions are the best choice to ensure your production quality.
AOI System
In-process Wafer Inspection System
Model 7945
- Double side inspection (post-diced wafer)
- Full color defect detection
- Fast multi-computer image processing
- Shared auto wafer loader
2D/3D Wafer Metrology System
Model 7980
Wafer Chip Inspection System
Model 7940
- Simultaneous double side color inspection
- 6" wafer/8" inspection area
- Automatic wafer alignment
- Wafer shape/edge identification
3D Optical Profiler
Model 7503
- Use white light interference measurement technique
- Modulized design
- Various surface measurement parameters, such as sectional difference, included angle, area, dimension, roughness, waviness, film thickness and flatness
Multi-Functional Optical Profiling System
Model 7505-01
- Specially designed for Panel Level Packaging, applications like TSV/VIA, RDL, Probe Mark, Surface Topography...etc
- 1D, 2D and 3D measurement capabilities
- Use white light interferometry to perform 3D Profile measurement, like surface measurement such step height, included angle, area, dimension, thickness, wave, film thickness and smooth level
- Perform 2D defect measurement via high resolution line scan camera to check for bubbles, scratches and foreign objects
Mini LED Backlight Module Automatic Optical Test System
Model 7661-K003
- Integrated 71803-2 2D Color Analyzer executes brightness, color, and defect analysis on Mini LED
- Test items: chromaticity, brightness, luminous intensity, uniformity, voltage, current, and dead lights
- Optional Chroma LED power tester and optical module allow integration into a test system
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