Chroma SoC Test System

Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

SoC Test System

SoC/Analog Test System
Model 3650-S2

12 Universal slots for digital, analog and mixed-signal applications
Up to 768 digital I/O and analog pins
50 / 100 MHz clock rate
100 / 200 Mbps (MUX) data rate

Wireless & RF Function Board
HDRF2

VST*4 ; RF port*32
Direct mount
8/16 sites test
Wi-Fi、BT、Sub 6GHz、IOT、GPS、LoRa、NB-IoT

Advanced SoC Test System
Model 3680

24 interchangeable slots for digital, analog and mixed-signal applications
Data rate up to 1Gbps
Up to 2048 sites parallel test
Up to 2048 digital I/O pins

High Density Audio Video Option
HDAVO

Chroma 3680 optional module

Advanced SoC/Analog Test System
Model 3650

Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
Expandable platform with up to 640 channels
50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA

Advanced SoC/Analog Test System
Model 3650-EX

Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
Expandable platform with up to 1024 IO channels and 96 DPS
50/100 MHz, 200 MHz (MUX) Test Rate
Varieties of high density options include VI45, PVI100, HDADDA and MRX