Chroma ATE Showcases Cross‑Domain Inspection Capabilities at Touch Taiwan 2026: New Breakthroughs in Panel-Level Packaging AOI, Integrated NED, and Smart Cockpit Testing

31 Mar 2026

Chroma ATE Showcases Cross‑Domain Inspection Capabilities at Touch Taiwan 2026: New Breakthroughs in Panel-Level Packaging AOI, Integrated NED, and Smart Cockpit Testing

Driven by the rapid growth of advanced semiconductor packaging for HPC (High Performance Computing), AI-powered autonomous driving, and AI smart glasses, Chroma will present three major next‑generation inspection technologies at this year’s Touch Taiwan: automated optical inspection (AOI) solutions for panel-level packaging (PLP), integrated NED (near-eye display) optical inspection solutions, and comprehensive testing systems for smart cockpit displays. These novel automated testing solutions will debut at the Touch Taiwan Electronic Equipment Exhibition, demonstrating Chroma’s commitment and capabilities in accelerating the transformation to AI-driven manufacturing.

Panel-Level Advanced Semiconductor Packaging AOI Solutions

For glass‑substrate processes in panel-level packaging, Chroma's AOI metrology system is built on our proprietary BLiS™ technology, offering non-destructive, high‑speed surface metrology and algorithm‑based analysis. This state-of-the-art solution supports multiple probe configurations for diverse applications and enables highly efficient measurement of TGV/VIA, RDL, and overlay structures. Results are traceable to NIST standards, while powerful 3D profile analysis tools allow users to examine sample structures in the finest detail. Developed entirely in‑house, Chroma’s precision mechanical design, dedicated algorithms, and high‑precision motion platform ensure exceptional performance, achieving sub‑micron resolutions that enable substantially improved alignment and measurement accuracy for complex structures.

Integrated NED Inspection Solutions

For AI smart glasses, Chroma offers fully integrated inspection solutions covering the entire process, from waveguides and light engines to display subassemblies and finished products. The Chroma 5746 benchtop system, paired with the Chroma 71803 Series 2D Color Analyzer, supports comprehensive optical evaluations including: Viewing Angle, Luminance, Chromaticity, Uniformity, Contrast, MTF, Optical Axis Alignment, Flare, and Ghosting — significantly boosting measurement efficiency and consistency.
For automated production inspections, the 574X series integrates a color analyzer and standard light source to deliver a complete optical inspection platform. By incorporating PA/AA alignment technologies, the system supports high‑precision alignment, assembly, and final test processes, meeting the needs of different product generations and application scenarios.

Comprehensive Automotive Smart Cockpit Automated Test System

Modern AI-driven smart cockpits—spanning display, audio, and communication modules—require efficient and stable communications for effective integration. The Chroma 2800 Automotive Smart Cockpit Test System delivers a one‑stop automated testing platform supporting video signals, power, audio, and Wi-Fi testing. The system can be configured with the Chroma 27016 Integration Tester, which supports a flexible range of modules such as FPD‑Link™ and GMSL™, as well as a Power module. When equipped with the 2238 Video Pattern Generator, the platform supports the latest video interfaces including DisplayPort 2.1 UHBR20HDMI 2.1 48Gbps, and USB Type‑C PD 3.2 140W, and can also integrate color analyzers. This convenient and versatile platform is ideal for automated testing of complex automotive displays and power disturbance conditions.

At the Touch Taiwan 2026 Electronic Equipment Exhibition (April 8–10), Chroma ATE will showcase: panel-level AOI precision metrology solutions, comprehensive smart cockpit inspection systems, and NED and AR display optical testing solutions. We warmly invite you to join us at Taipei Nangang Exhibition Center, Hall 1, 4th Floor, to experience the next generation of testing technologies. We look forward to seeing you at this year's event.

 

BLiS™ WLP/PLP 3D Metrology System

 

FPD (Flat Panel Display) Test Solutions

 

Video & Color Test Solutions