-
MyChroma
-
メールマガジンの配信登録メールマガジンの配信登録
We will irregular release Chroma solutions, technics, exhibitions, seminar and webinar news. Subscribe today to get more information.
-
0お問合せカート
-
海外拠点
Tel: +81-45-542-1118
Email Chroma: info@chroma.co.jp
お問い合わせ先
Quick Menu
ピックアップ＆プレースハンドラ
Hybrid Single Site Test Handler
Model 3110
- Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃)
- FT+SLT Handler (Two In One)
- Perfect for Device Engineering Characterization Gathering and Analysis
- Auto Tray Load/unload & Device Sorting capability
- Tester Zero waiting time
低高温(ATC)ICテストハンドラ
Model 3110-FT
- 設定可能温度 -40~125℃
- FT試験及びSLT試験対応
- 測定可能パッケージ寸法 3x3 mm~45x45 mm
- コンタクト圧制御可能範囲 1~10 kg (オプション)
Tabletop Single Site Test Handler
Model 3111
- Tabletop design for smaller table space 60 cm2
- (2) Fixed JEDEC trays
- IC package size ranges: 5x5mm to 45x45mm
- Software configurable binning
RF Solution Integrated Handler
Model 3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
Die Test Handler
Model 3112
- Reliable Pick&Place bare die test handler
- Multi-plate input and automated test sorting capability
- Omni-directional adjustable probe stage (X/Y/Z/θ)
- Stage remain die check function
Tri-Temp Octal Sites Handler
3160-C
- Advance thermal technology (Nitro TEC)
- Faster index time 0.6 sec
- Active thermal control and full range temperature
- Chamber less design
Octal Site Test Handler
Model 3180
- Up to x8 parallel test sites
- Up to 9000 UPH
- Temperature test from ambient ~150℃
Automatic System Function Tester
Model 3240
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
Automatic System Function Tester
Model 3260
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
Miniature IC Handler
Model 3270
Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level.
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
- Temperature range of -40°C to 150°C
- Compact footprint
- Self-contained – No external chiller required
- Liquid-free Operation
- ↑