ピックアップ＆プレースハンドラ

Chroma's IC test and handler solutions assure that the IC packaging meets the original design specifications and verify the performance of the IC before it is assembled in the electronic product. The pick-and-place IC handler can be used in the system-level test and final test for all sorts of ICs. Working with a tri-temp controller enables simulation of use in a harsh environment under extremely low and high temperatures. Combined with various automated designs, Chroma's IC handler can meet all your testing needs. Chroma Virtual Operation Tools can remotely monitor the test process, predict the handler's test efficiency through big data, and improve your product's test yield.

ピックアップ＆プレースハンドラ

Hybrid Single Site Test Handler
Model 3110

Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃)
FT+SLT Handler (Two In One)
Perfect for Device Engineering Characterization Gathering and Analysis
Auto Tray Load/unload & Device Sorting capability
Tester Zero waiting time

低高温(ATC)ICテストハンドラ
Model 3110-FT

設定可能温度 -40~125℃
FT試験及びSLT試験対応
測定可能パッケージ寸法 3x3 mm~45x45 mm
コンタクト圧制御可能範囲 1~10 kg (オプション)

Tabletop Single Site Test Handler
Model 3111

Tabletop design for smaller table space 60 cm2
(2) Fixed JEDEC trays
IC package size ranges: 5x5mm to 45x45mm
Software configurable binning

RF Solution Integrated Handler
Model 3240-Q

The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.

Die Test Handler
Model 3112

Reliable Pick&Place bare die test handler
Multi-plate input and automated test sorting capability
Omni-directional adjustable probe stage (X/Y/Z/θ)
Stage remain die check function

Tri-Temp Octal Sites Handler
3160-C

Advance thermal technology (Nitro TEC)
Faster index time 0.6 sec
Active thermal control and full range temperature
Chamber less design

Octal Site Test Handler
Model 3180

Up to x8 parallel test sites
Up to 9000 UPH
Temperature test from ambient ~150℃

Automatic System Function Tester
Model 3240

Innovative handler for high volume/multi-site IC testing at system level.
Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.

Automatic System Function Tester
Model 3260

Innovative handler for high volume/multi-site IC testing at system level.
Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.

Miniature IC Handler
Model 3270

Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level.

Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R

Temperature range of -40°C to 150°C
Compact footprint
Self-contained – No external chiller required
Liquid-free Operation

ピックアップ＆プレースハンドラ

SoC試験システム