-
AbonnementAbonnement
We will irregular release Chroma solutions, technics, exhibitions, seminar and webinar news. Subscribe today to get more information.
-
0Inquiry cart
Quick Menu
Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.
VLSI Testsystem
VLSI Test System
Model 3380P
- 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
- Up to 512 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSI Test System
Model 3380D
- 100 MHz clock rate, 256 I/O digital I/O pins
- Up to 256 sites Parallel testing
- Various VI source
- Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSI Test System
Model 3380
- 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
- Up to 1024 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
High Voltage Device Power Supply
Model 33021
- Max. 48V DC output with 2 channels per card
PXIe Programmable Device Power Supply
Model 33020
- High channel density with 8 channels per card
Universal Relay Driver Control
Model 33011
- PXIe based universal relay control
- 32CH direct relay drivers
- 2 lanes of SPI relay control interface
Hochgeschwindigkeits-PXIe Digital-IO-Karte
Model 33010
- Standard PXIe-Busanschluss
- 100 MHz maximale Taktfrequenz
- 32 Kanäle pro Karte
- ↑